Enhanced temperature coefficient of resistance in nanostructured Nd0.6Sr0.4MnO3 thin films

Mrinaleni R S, E P Amaladass, S Amirthapandian, A.T. Sathyanarayana,Jegadeesan P,K Ganesan,Chanchal Ghosh, R M Sarguna,P.N. Rao,Pooja Gupta,T Geetha Kumary,Arup Dasgupta,S.K. Rai,Awadhesh Mani

Thin Solid Films（2023）

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Abstract

•Nd0.6Sr0.4MnO3 thin films were fabricated using pulsed laser deposition technique.•The films exhibited granular and crossed-nano rod type morphologies.•A deliberate TiO2 termination on SrTiO3 substrate yields films with rod morphology.•Thin films with rod morphology offer enhanced temperature coefficient of resistance.•A maximum temperature coefficient of resistance of 21% was obtained.

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Key words

Manganite thin films,Growth dynamics,Crossed-nanorod morphology,Metal-toinsulator transition,Temperature coefficient of resistance

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