Degradation behavior of CIGS solar Cells: A parametric analysis

Mohsen Jahandardoost,Curtis Walkons,Shubhra Bansal

Solar Energy（2023）

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Abstract

•Devices with cliff conduction band offset are sensitive to interface defects.•Minimum depletion width has been identified as an important interface parameter.•Inflection in NCV-W curves in reverse bias is due to 0.55 eV deep acceptors.•Midgap neutral defects, deep acceptors and interface defects decrease VOC.•Decrease in OVC ionized acceptors and increase in back contact barrier decrease VOC.•All modeling results corroborated with experimental stress testing results.

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Key words

accelerated stress test (AST), SCAPS-1D, Defect, Conduction band offset, ordered vacancy compound (OVC), Buffer

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