Learning-Oriented Reliability Improvement of Computing Systems from Transistor to Application Level.

Behnaz Ranjbar,Florian Klemme,Paul R. Genssler,Hussam Amrouch,Jinhyo Jung,Shail Dave,Hwisoo So, Kyongwoo Lee,Aviral Shrivastava,Ji-Yung Lin,Pieter Weckx,Subrat Mishra,Francky Catthoor,Dwaipayan Biswas,Akash Kumar

2023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE（2023）

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Key words

Aging,Cross-layer reliability,Device and circuit reliability,Dynamic reliability estimation,Error mitigation,Machine learning for systems,Task scheduling,Timing reliability

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