Research on the optical properties of SiO2-Al2O3 sintering material

With the wide application of optical thin films, the requirements for the spectral transmission range and refractive index of thin film materials are getting higher and higher. In this paper, a new type of thin film material sintered from SiO₂ and Al₂O₃ is studied. The single-layer film was evaporated by electron beam evaporation, and its refractive index uniformity was measured by ellipsometer and its spectral transmission range was measured by spectrophotometer and Fourier spectrometer. Finally, a multi-layer high-reflection film is prepared by using the material, and the film has a high reflectivity and a flat and uniform surface.