Analysis of high-resolution spectra of SiF4 combination bands

The infrared spectra of the silicon tetrafluoride molecule (SiF4) recorded on the AILES Beamline of the SOLEIL Synchrotron facility, have been studied in the range where the combination bands v1+v3, v1+v4, v2+v3 and v2+v4 are located. For each band, between 1100 and more than 2300 lines have been assigned and fitted with the effective Hamiltonian model for J values up to 55 (up to 82 for v1+v3). The obtained set of spectroscopic parameters allows one to reproduce experimentally obtained line positions with a root mean square deviation better than drms = 0.863 x 10-3 cm-1.