FDSOI for Cryocmos Electronics: Device Characterization Towards Compact Model

M. Casse,B. Cardoso Paz, F. Bergamaschi,G. Ghibaudo, F. Serra,G. Billiot,A. G. M. Jansen,Q. Berlingard,S. Martinie,T. Bedecarrats,L. Contamin,A. Juge,E. Vincent,P. Galy,M. A. Pavanello,M. Vinet,T. Meunier,F. Gaillard

2022 International Electron Devices Meeting (IEDM)（2022）

Cited 5|Views2

Key words

analytical models,characteristic electrical parameters,cryoCMOS electronics,cryogenic compact models,device characterization,electrical characterization,FDSOI transistors,low temperature operation,physical models,singular transport,thermal effects

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