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Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO4)2 and NaNd(MoO4)2 Ceramics Irradiated with High-Energy Ions

TECHNICAL PHYSICS(2024)

Cited 1|Views9
Key words
X-ray diffraction,parallel beam method,grazing incidence geometry,ion irradiation,ceramics,radiation resistance,amorphization,damaged layer
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