Wide band dielectric measurement technology with variable temperature based on free space method

This paper presents a wide band measurement technique with variable temperature based on free space method. The test temperature range is from room temperature to 1200 degrees C, and the test frequency range is from 65GHz to 110GHz. A test fixture with variable temperature function and a high-frequency ultra-wideband metal focusing antenna are used. The calculation algorithm based on the principle of free space transmission and reflection uses TRL calibration and time domain gate to ensure the accuracy of the test results. Based on this method, we tested the temperature of quartz and other materials in the frequency range of 65GHz similar to 110GHz. This technique can accurately measure dielectric parameters of low loss materials in variable temperature and wide band, and the test results are stable and repeatable.