Challenges for Waveform Sampling and Related Technologies

Haruo Kobayashi,Kentaroh Katoh,Shuhei Yamamoto,Yujie Zhao,Shogo Katayama,Jianglin Wei, Yonglun Yan,Dan Yao,Xueyan Bai,Anna Kuwana

2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)（2022）

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摘要

Waveform sampling and their related technologies are important for electronic appliances, IoT, automotive, social infrastructure and 5G, 6G devices as well as their testing systems. This paper reviews them mainly based on the authors’ laboratory research results, and discusses their challenges.

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waveform sampling

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