Using Compact Model to Verify IGZO RO Performance for Engineering Application
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)（2022）
Key words
2D front,3D front,back gate IGZO transistors,engineering application,IGZO RO performance,InGaZnO/int,integrated circuit,Kimizuka,manufacturing circuit designer,process variation,ring oscillator circuit performance,SPICE models,surface-potential based compact model
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