Development of a Technique for Analysis of Cerium Oxide by Arc Atomic Emission Spectrometry

A technique for arc atomic emission analysis of cerium oxide has been developed which meets today’s requirements for the accuracy and sensitivity of the impurity determination. The range of impurities that can be determined is significantly expanded compared to the standardized method of the 1970s. This improvement of metrological characteristics has been primarily attained through the use of instrumental capabilities of Grand Globula, an atomic emission facility distributed by VMK-Optoelektronika (Russia). To specify balanced conditions for the determination of 15 rare earth element impurities and another 19 elements, analytical lines have been selected and the dependence of their intensity on the operational mode of the generator, the shape and size of the electrodes, the distance between electrodes, the ratio of the masses of the analyzed sample and graphite powder, and the presence of various carriers (Ga 2 O 3 , NaCl, NaF, KCl, S, GeO) has been analyzed. In studying impurity evaporation curves, an exposure time has been determined that is sufficient for their complete evaporation (100–120 s). The metrological characteristics of the proposed procedure for the analysis of cerium oxide have been evaluated in comparison with the standardized method.