Comparative Study of 940 nm VCSELs Grown on Ge and GaAs Substrates

Jack Baker,Craig P. Allford,Sara Gillgrass,T. Peach,Andrew D. Johnson,Andrew M. Joel,Sung Wook Lim,Matthew Geen,J. Iwan Davies,Samuel Shutts,Peter M. Smowton

2022 IEEE Photonics Conference (IPC)（2022）

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摘要

Results from an experimental comparison of like-for-like VCSELs grown on GaAs and Ge substrates are presented. Comparable performance, in terms of threshold current, device efficiency, and thermal management, is demonstrated.

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