Electromagnetic Pattern Cluster in Latent Space in Near Filed Scanning of a Device.

Electromagnetic pattern is an image generated from near field electromagnetic field of a device such as microprogrammed control unit (MCU) when it is working. Many Electro-Magnetic Interference (EMI) sources can be located using the electromagnetic patterns. The cluster of electromagnetic patterns is helpful to distinguish the types of EMI, and problems caused by the same EMI are basicly addressed in the same way. Different frequencies in integrated circuite (IC) can have the same electromagnetic patterns, especially for those frequencies that are multiple integer of a small frequency called the basic frequency. The magnitude of electromagnetic pattern becomes weak when the the corresponding frequency gets higher, which makes the EMI source cluster inaccurate. To tackle this problem, we cluster the electromagnetic patterns in the latent space.