28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers

Alessandro Grossi,Matteo Coppetta, Stefano Aresu, Andreas Kux,Thomas Kern, Robert Strenz

2023 IEEE International Memory Workshop (IMW)（2023）

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Abstract

We present features adding extra reliability margin for emerging Non-Volatile Memories adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm RRAM Data Memory on high statistics from a microcontroller demonstrator. The results reported show that 28nm embedded RRAM reached an adequate maturity and is ready for replacement of embedded Flash in automotive applications.

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