New Level of Development of Secondary Ion Mass Spectroscopy for Materials Science

A. I. Kovalev,V. O. Vakhrushev,D. L. Wainstein, A. Yu. Rashkovsky, A. A. Tomchuk, S. A. Dmitrievskii, E. P. Konovalov, A. D. Mukhsinova,A. I. Volkov

METALLURGIST(2023)

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Abstract
The article shows the possibilities of the method of time-of-flight secondary ion mass spectroscopy for solving a wide range of materials science problems on the examples of studying the oxidation of a multilayer wear-resistant coating based on TiAlCrSiYN/TiAlCrN, chemical inhomogeneity in rolled high-strength steel, free-machining steel, and multilayer planar plasmon coatings for solar cells, as well as for more precise attribution of historical art ceramic items.
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multilayer wear-resistant coatings based on TiAlCrSiYN, TiAlCrN, free-machining steel, planar plasmon coatings, art ceramics
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