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Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified

M. P. Sruthi,M. Asaduz Zaman Mamun,Deleep R. Nair,Anjan Chakravorty,Nandita DasGupta,Amitava DasGupta,Muhammad Ashraful Alam

2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS（2023）

引用 1|浏览14
关键词
Hetero-integration,Self-heating,Reliability,Keep-out-zone
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