Hyperspectral photoluminescence and reflectance microscopy of 2D materials
MEASUREMENT SCIENCE AND TECHNOLOGY(2024)
Abstract
Optical micro-spectroscopy is an invaluable tool for studying and characterizing samples ranging from classical semiconductors to low-dimensional materials and heterostructures. To date, most implementations are based on point-scanning techniques, which are flexible and reliable, but slow. Here, we describe a setup for highly parallel acquisition of hyperspectral reflection and photoluminescence (PL) microscope images using a push-broom technique. Spatial as well as spectral distortions are characterized and their digital corrections are presented. We demonstrate close- to diffraction-limited spatial imaging performance and a spectral resolution limited by the spectrograph. The capabilities of the setup are demonstrated by recording a hyperspectral PL map of a MoSe2-WSe2 lateral heterostructure, grown by chemical vapor deposition (CVD), from which we extract the luminescence energies, intensities and peak widths across the interface.
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Key words
hyperspectral imaging,2D materials,optical spectroscopy,material characterization,photoluminescence spectroscopy,reflectance microscopy
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