Adapted metrics on locally conformally product manifolds
PROCEEDINGS OF THE AMERICAN MATHEMATICAL SOCIETY(2024)
Abstract
We show that the Gauduchon metric g0 of a compact locally conformally product manifold (M, c, D) of dimension greater than 2 is adapted, in the sense that the Lee form of D with respect to g0 vanishes on the D -flat distribution of M. We also characterize adapted metrics as critical points of a natural functional defined on the conformal class.
MoreTranslated text
Key words
Conformal geometry,Weyl structure,Gauduchon metric,LCP structure
AI Read Science
Must-Reading Tree
Example
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined