Optimal Weight Models for Ferroelectric Synapses Toward Neuromorphic Computing
IEEE TRANSACTIONS ON ELECTRON DEVICES(2023)
Key words
FeFETs,Computational modeling,Synapses,Logic gates,Voltage measurement,Neuromorphic engineering,Temperature measurement,Ferroelectric synaptic transistor,metal-ferroelectric-metal-insulator-semiconductor (MFMIS),neuromorphic computing,Index Terms,symmetric nonlinearity model,weight model
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