Comparison of Neutron Radiation Testing Approaches for a Complex SoC
IEEE Transactions on Nuclear Science（2023）
关键词
Testing,Random access memory,Performance evaluation,Neutrons,Metals,Field programmable gate arrays,Software,Commercial off-the-shelf (COTS),MPSoC,neutron testing,single-event upset (SEU),systems-on-a-chip (SoC),Xilinx
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