Research on Space Radiation Effect of New Mass Storage

In this paper, the space radiation effect and experimental study of a new commercial large-capacity NAND Flash are carried out. The total dose test and single particle test of anti-ionization of MT29F series 16G and 128G NAND Flash produced by MICRON Company with different capacity plane and 3D technology are carried out by using cobalt -60 y ray source and heavy ion accelerator, and the experimental data are obtained to evaluate the anti-radiation reliability of its space application. On this basis, the floating gate cell multi-bit storage mode and 3D technology new super-capacity NAND Flash radiation test evaluation method are explored, which provides technical basis and guarantee for aerospace engineering design and test evaluation.