Low Latency SEU Detection in FPGA CRAM with In-Memory ECC Checking
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS（2023）
关键词
Field programmable gate arrays,Error correction codes,Maintenance engineering,Single event upsets,Redundancy,Radiation hardening (electronics),Random access memory,Bitstream scrubbing,ECC,FPGA,MBU,MCU,partial reconfiguration,SEU,SET,TMR
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