A deep learning model for automatic analysis of cavities in irradiated materials

Qinyun Chen, Chaohui Zheng,Yue Cui,Yan-Ru Lin,Steven J. Zinkle

COMPUTATIONAL MATERIALS SCIENCE(2023)

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Abstract
Transmission electron microscopy (TEM) is a commonly used technique in materials science for defect investi-gation. Quantitative analysis of defects is important for understanding the properties of a material, but manual analysis of TEM micrographs can be time-consuming and prone to error, especially when the defects have irregular shapes rather than spherical shapes. Many existing methods or deep learning models do not handle a wide range of sizes for the same object type within a single image. In this work, we present a framework that enables users to train an instance segmentation model called Mask R-CNN on any microstructure dataset, perform multi-detection on the same image at different scales, and obtain properties (e.g., size, area) of the objects based on the desired shape (e.g., circle, ellipse, rectangle). Additionally, we have developed a parallel detection module that uses multiple GPUs to increase the efficiency of the object detection process. We demonstrate the capabilities of our framework using a set of TEM images of cavities with different shapes, size distributions, and background contrasts. Finally, we show that the performance of our model in terms of density, size, and swelling of the cavities is comparable to the human average and that our model achieves the highest recall value compared to existing methods due to the use of image multi-rescaling.
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Key words
Object detection,Cavities,TEM image analysis
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