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High-speed multiparametric imaging through off-resonance tapping AFM with active probe

Peng Li,Yongjian Shao,Ke Xu,Xiucheng Liu

Ultramicroscopy（2023）

Cited 0|Views41
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Abstract
•Off-resonance tapping (ORT) mode of AFM is widely concerned due to its advantages of weak tip-sample interaction and concurrent quantitative property mapping.•ORT-AFM has the disadvantage of slow scan speed caused by low modulation frequency.•Active probe actuates the cantilever directly, and thus increase modulation frequency in ORT-AFM.•High-speed multiparametric imaging with the active probe method in ORT-AFM is provided.
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Key words
High-speed atomic force microscopy,Off-resonance tapping,Active probe
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