Valence fluctuation in Yb3Si5 probed by synchrotron X-ray photoemission spectroscopy

JAPANESE JOURNAL OF APPLIED PHYSICS(2023)

引用 1|浏览11
暂无评分
摘要
We report the direct evidence of valence fluctuation in the thermoelectric material Yb3Si5 by using synchrotron X-ray photoemission spectroscopy. The Yb 3d core level photoemission spectrum of a Yb3Si5 single crystal shows clear separation of the Yb2+ peak and Yb3+ multiplet peaks. From the spectral weight of each component, the mean valence of Yb ions is estimated to be +2.67 at 20 K. Furthermore, a Kondo resonance peak just below the Fermi energy is also observed by high-resolution soft X-ray photoemission spectroscopy, suggesting the valence fluctuating state in Yb3Si5.
更多
查看译文
关键词
valence fluctuation,thermoelectric material,HAXPES,SXPES
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要