Spectral shift of the plasmon maximum on the rough anodized Ti surface in the presence of PVA films with Bi2O3 and Bi2O3/Tm2O3 complexes

The effect of the thickness of the polyvinyl alcohol film on the position of the plasmon maximum at the modified titanium-dielectric interface was investigated. The integration of bismuth oxide, thulium oxide, as well as their mixtures into thin polymer films (thickness of up to 1.3 mu m) was carried out. It was established that the spectral shift of the plasmon maximum into the red region of the spectrum is due to the roughness features of the titanium surface as a result of anodizing and due to the thickness of the PVA film. The presence of the overlap in the reflection spectra of thulium oxide and bismuth oxide has been established, which leads to a complete leveling of the spectral band of thulium oxide in the region of 350 nm.