The Accelerated Life Test Investigation and Lifetime Prediction Method for LED Driver

Reliability evaluation for products with long lifetime and high reliability is a great challenge in reliability engineering. LED luminaires are one of the most popular lighting solutions of the current society due to their long-lasting and energy-efficient. The system reliability of the LED luminaire is determined by the performance of the driver electronics. This paper analyzes the LED driver failure forms and the possible causes, in order to study the failure mechanism of LED driver and predict the lifetime. The accelerated life model of the driver is also established and the method to get the parameters in the model has been discussed. A high accelerated life testing platform has been built to test the sample's lifetime and get the parameters in the accelerated life model. The lifetime of sample is estimated by the model quickly and correctly.