Quantum-interference origin and magnitude of 1/f noise in Dirac nodal line IrO₂ nanowires at low temperatures

We present 1/f noise measurements of IrO2 nanowires from 1.7 to 350 K. Results reveal that the noise magnitude (represented by Hooge parameter ?) increases at low temperatures, indicating low-frequency resistance noise from universal conductance fluctuations. The cause of this noise is determined to be due to oxygen vacancies in the rutile structure of IrO2. Additionally, the number density of these mobile defects can be calculated from the vT resistance rise caused by the two-channel Kondo effect in the Dirac nodal line metal IrO2.