Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces

Within the framework of the first-order small perturbation method, we derive the statistics of the layered rough surface index and the normalized difference polarization index for three-dimensional layered structures with slightly rough interfaces illuminated by a monochromatic plane wave and for multilook returns. We establish closed-form expressions for the probability density function and cumulative distribution function. The first-and second-order moments are given by relation recurrences. We validate from Monte Carlo simulations the obtained theoretical formulas.