Toward Probing Surface Magnetism with Highly Charged Ions

X-rays produced during collisions between Highly Charged Ions (HCI) and sample surfaces can potentially be used to investigate the surface's magnetic properties, taking advantage of the (partial) conservation of the spin of the electrons captured by the ion during the collision. We conducted studies to characterize the X-ray detection system and to determine, with a sub-degree accuracy, the incident angle between the incoming ions and the sample surfaces. A series of proof-of-principle experiments are presented involving an Ar17+ ion beam interacting with a nonmagnetic Si sample. The obtained X-ray spectra show a significant dependency in terms of X-ray yield and energy on the ion incidence angle. These findings will be used to guide future ion-magnetic surface studies.