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Practical Guide to Understanding Goodness-of-fit Metrics Used in Chemical State Modeling of X-Ray Photoelectron Spectroscopy Data by Synthetic Line Shapes Using Nylon As an Example

Neal Fairley,Pascal Bargiela,Adam Roberts,Vincent Fernandez,Jonas Baltrusaitis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A（2023）

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X-ray Photoelectron Spectroscopy
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