Modeling coupled lines in 65 nm CMOS for millimeter-wave applications

Lexington, KY(2014)

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摘要
An analysis of the behavior of coupled lines in the 100-200 GHz frequency range is presented. Characterization of lumped and electromagnetic elements are included as a preliminary work to predict the behavior of the line in a Rotary Traveling Wave Oscillator (RTWO) integrated circuit. Using Sonnet and Agilent ADS, the simulated behavior of a coupled transmission line implemented in 65 nanometer CMOS is presented as well as the method used for modeling the lines.
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关键词
coupled transmission lines,field effect mimic,oscillator strengths,oscillators,agilent ads,cmos integrated circuits,rtwo,sonnet,coupled transmission line,frequency 100 ghz to 200 ghz,millimeter-wave integrated circuits,rotary traveling wave oscillator,size 65 nm,transmission lines,coupled microstrips,modeling and simulation,power transmission lines,microstrip,scattering parameters,fitting,layout,semiconductor device modeling
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