Application-Oriented Reliability Testing of Power Electronic Components and Converters

Huai Wang,Francesco Iannuzzo,Amir Sajjad Bahman,Kaichen Zhang,Peng Xue,Yi Zhang,Bo Yao,Zhan Shen,Ariya Sangwongwanich,Ionut Vernica,Yubo Song,Subham Sahoo,Frede Blaabjerg

IEEE POWER ELECTRONICS MAGAZINE（2022）

引用 6|浏览11

关键词

Semiconductor device measurement,Power measurement,Uncertainty,Failure analysis,Power electronics,Loss measurement,Power system reliability,Energy management,Converters,Testing

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