Stress analysis of aspherical TRISO-coated particle with X-ray computed tomography

•Micro X-ray computed tomography was utilized to measure the layer thickness of TRISO-coated particle.•The stress distribution of the aspherical reconstructed SiC was simulated with FEM based on the pressure vessel model.•The SiC asphericity measured with X-ray CT will contribute to a higher failure probability under irradiation.