Misalignment-Tolerant Multi-Tip Inverse Tapered Silicon Nitride Edge Couplers

Essam Berikaa,Santiago Bernal,Mustafa Hammood,Lukas Chrostowski,David V. Plant

2022 IEEE Photonics Conference (IPC)（2022）

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摘要

This work presents the design and characterization of multi-tip SiN inverse tapered edge couplers. Our measurements and simulations show that increasing the number of tips effectively improves the horizontal misalignment tolerance compared to conventional linear tapered edge couplers.

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关键词

silicon,misalignment-tolerant,multi-tip

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