Nano-apertures Vs. Nano-Barriers: Surface Scanning Through Obstacles and Super-Resolution in AFM-NSOM Dual-Mode
Nano-Structures & Nano-Objects（2022）
Key words
Aperture and barrier obstacles,Diffraction,Rayleigh criterion,Atomic Force Microscope (AFM),Near-field scanning optical microscope (NSOM),Numerical and analytical analyses
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