Be SMART, Save I/O: A Probabilistic Approach to Avoid Uncorrectable Errors in Storage Systems

2022 IEEE International Conference on Cluster Computing (CLUSTER)(2022)

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摘要
Silent data corruption poses a significant risk to the integrity of data in storage systems. Although error correction codes (ECC) can recover the majority of such errors, a non-negligible portion of them escape ECC, referred as uncorrectable errors (UEs). Despite being rare in nature, increasing scale of storage systems and fast-growing I/O rates decreased the mean time between UEs from months to hours. Yet, unlike disk failures, UEs are hard to predict with high precision, making it difficult to adopt proactive measures. In this paper, we introduce a probabilistic approach to deploy UE mitigation strategies that can capture significant portion of UE while keeping the system overhead at a tolerable range. To achieve this, we first estimate the probability of I/O operations to be exposed to UEs and find a minimum subset of disks for which employing UE avoidance strategies can lead to significant decrease in UE exposure. We demonstrate through extensive simulations that when the proposed probabilistic model is used to implement write verification strategy to detect and recover from UEs, more than 50% of all write-triggered UEs can be avoided with 1% read overhead, and more than 70% of UEs can be mitigated with less than 3.5% read overhead. We further measure the impact of incurred read overhead on write performance in production Lustre and GPFS file systems and validate our findings that more than half of UEs can be avoided while degrading write I/O throughout by less than 0.9%.
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关键词
probabilistic approach,avoid uncorrectable errors,storage systems,error correction codes,UE mitigation strategies,system overhead,UE avoidance strategies,UE exposure,write-triggered UEs
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