Non-Volatile Memory Destructive Failure in Standby Mode

Pierre-Xiao Wang,Alexandre Bosser,Pierre Kohler, Thibaut Lopez,Frédéric Lochon, Gabriel Duran

2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2021）

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Abstract

This paper presents the results of a 256Mb SPI/QSPI non-volatile memory (NVM) SEE characterization. Destructive failures were observed during SEE tests, and the DUT shows sensitivity especially in standby mode instead of Erase/Write/Read modes.

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Key words

destructive,erase/write/read,non-volatile memory,SEE,SEL,SEU,SPI,standby

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