SEE Radiation Analysis And Mitigation on SAM3X8ERT Microcontroller

Roberta Pilia,Remi Espinasse, Christophe Poulet,Francoise Bezerra, Laurene Gillot,Benjamin Treuillard,Simon Dumortier

2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2021）

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摘要

This paper reports results and analysis of a Single Event Effects (SEE) test campaign conducted by CNES and EREMS. The DUT used for the study was the SAM3X8ERT Microcontroller from Microchip.

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关键词

Single Event Effects,microcontroller,SEU,mitigations,flash memory

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