Full-scale exfoliation of InGaN-based light-eMitting diodes via Microcavity-assisted crack propagation by using tensile-stressed Ni layers

Jung-Hong Min, Tae-Hoon Jeong,Kwang Jae Lee,Jung-Wook Min,Tae-Yong Park,Tien Khee Ng,Boon S. Ooi

2022 28th International Semiconductor Laser Conference (ISLC)（2022）

引用 0|浏览6

暂无评分

摘要

We demonstrated microcavity-assisted crack propagation for the full-scale exfoliation of a InGaN-based light-emitting diode (LED) membrane by using nanoporous structures and tensile-stressed Ni layers. The blue LED membrane was transferred on a glass slide by using an adhesive bonding and showed good performance.

查看译文

关键词

crack propagation,full-scale,ingan-based,light-emitting,microcavity-assisted,tensile-stressed

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要