A σ = 0.66 LSB 8-bit Time-to-Digital Converter with Variable Resolution in a 180nm CMOS Technology

2022 IEEE International Conference on Engineering Veracruz (ICEV)(2022)

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摘要
This work presents an 8-bit Time-to-Digital Converter (TDC) suitable for time-lapse measurement applications. The proposed TDC is composed of two nested 4-bit counters, a digital-logic control network, a register, and a decoder. Verilog language was used to synthesize the TDC using the standard cells of the technology. The system has a standard digital output and it is powered by a 1.8 V supply with a total power consumption of 9.86 mW. The characterization was performed by means of post-layout simulations using a TSMC 180 nm CMOS technology. The proposed structure exhibits a 355.4 μm × 105.8 μm area. In addition, this TDC has a standard deviation of 0.66 LSB with a fixed input time interval with a user-select operation frequency from 1 MHz to 1 GHz.
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关键词
Time-to-Digital converter,TDC,Johnson counter,Nested counters,Time-lapse measurement,All-digital,VLSI,Verilog,Single-shot test
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