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Wafer-level Testing of Inverse-Designed and Adjoint-Inspired Dual Layer Si-SiN Vertical Grating Couplers

Thomas Van Vaerenbergh,Sean Hooten,Mudit Jain,Peng Sun,Quentin Wilmart,Ashkan Seyedi,Zhihong Huang,Marco Fiorentino,Ray Beausoleil

JPhys photonics（2022）

Cited 6|Views20
Key words
wafer-level testing,silicon photonics,adjoint-inspired,inverse design,grating coupler
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