An end-to-end approach to identify and exploit multi-fault injection vulnerabilities on microcontrollers

Journal of Cryptographic Engineering(2022)

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摘要
Although multi-fault attacks are powerful in defeating sophisticated hardware and software countermeasures, detecting and exploiting multi-fault injection vulnerabilities remains a difficult problem, especially without any prior knowledge of the target. We propose a new end-to-end approach to identify and exploit multi-fault injection vulnerabilities. This tool-assisted methodology lets us configure a given fault injection equipment according to realistic multi-fault injection simulations based on target specific fault models. In addition, we show that we experimentally achieve with our method successful multi-fault attacks, up to 30 times faster than the characterization-based approach, on different microcontrollers and with various fault injection techniques.
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关键词
Multiple fault injection,Fault injection simulation,Laser fault injection,Voltage fault injection,Fault model,Microcontroller
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