Understanding the direct detection of charged particles with SiPMs

F. Carnesecchi, G. Vignola, N. Agrawal, A. Alici,P. Antonioli, S. Arcelli,F. Bellini, D. Cavazza, L. Cifarelli, M. Colocci, S. Durando, F. Ercolessi, A. Ficorella, C. Fraticelli,M. Garbini, M. Giacalone,A. Gola, D. Hatzifotiadou, N. Jacazio, A. Margotti, G. Malfattore,R. Nania, F. Noferini, G. Paternoster,O. Pinazza,R. Preghenella,R. Rath, R. Ricci, L. Rignanese, N. Rubini, B. Sabiu,E. Scapparone,G. Scioli, S. Strazzi,S. Tripathy, A. Zichichi

arxiv（2023）

引用 1|浏览10

暂无评分

摘要

In this paper, evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

查看译文

关键词

particles,direct detection

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要