Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process

Weian Yan, Xiaofan Xu,David Bigaud, Wenqin Cao

Reliability Engineering & System Safety(2023)

引用 6|浏览4
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摘要
•The Tweedie exponential dispersion process model based on SSADT is generalized.•The optimum plan is the one that uses only the minimum and maximum stress levels.•An explicit expression of allocation proportion is given.•The proposed optimum plan can improve the performance through validation.
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关键词
Reliability,Step-Stress Accelerated Degradation Test,Tweedie Exponential Dispersion Process,Optimal Design
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