P‐5.8: Improving Cross Line Defects of Ultra Narrow Bezel Displays by Decreasing Foreign Matter

Cross line defects are stubborn problems which puzzles ultra narrow bezel displays for a long time. It not only seriously lower yield of ultra narrow bezel displays, but also is difficult to repair in cell processing by NRP (normal repair). In this paper we mainly describe improving cross line defects by decreasing foreign matter in the process of CVD (Chemical Vapor Deposition).