Electrical characterization and modeling of FDSOI MOSFETs for Cryo-Electronics
2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)(2022)
摘要
We present an overview of DC electrical characterization of FDSOI transistors down to very low temperature for cryogenic applications. We also highlight specific phenomena appearing at low temperature, and discuss the corresponding physical and analytical models.
更多查看译文
关键词
electrical characterization,FDSOI transistors,cryoelectronics
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要