Electrical characterization and modeling of FDSOI MOSFETs for Cryo-Electronics

Mikaël Cassé,Bruna Cardoso Paz,Gérard Ghibaudo,Maud Vinet

2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)（2022）

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摘要

We present an overview of DC electrical characterization of FDSOI transistors down to very low temperature for cryogenic applications. We also highlight specific phenomena appearing at low temperature, and discuss the corresponding physical and analytical models.

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关键词

electrical characterization,FDSOI transistors,cryoelectronics

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