Compact Modeling of Channel-Resistance Effects in Reconfigurable Field-Effect Transistors
2022 29th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)(2022)
Abstract
Reconfigurable field-effect transistors come with an additional gate contact, which leads to challenges for compact modeling. In this work, a closed-form and physics-based DC model is derived for those devices, which combines the injection current over the Schottky barriers with the resistance-effects of partially ungated device channel segments or long channel devices. The model verification is done by comparing the results to TCAD simulations and measurements.
MoreTranslated text
Key words
SBFET,RFET,compact modeling,closed-form,Schottky barrier,channel resistance,thermionic emission,field emission,tunneling current
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined