Defect generation behavior in Czochralski-grown ScAlMgO4 crystal using synchrotron X-ray topography

•X-ray topographic observation of SAM in-plane and cross-section wafers of same ingot.•Characterization of unique straight- and stream-type dislocations using extinction rules.•Observation of defect structure from early- to late-growth stages in SAM cross-section wafer.•Discussion of behavior of striations and dislocations.•Close-correlation between defect structures and thermal strain in CZ-growth.