Influence of negative voltage between gate and emitter to the turnoff behavior of IGBT device

Fumio Yukawa,Taku Takaku, Naoto Fujisawa,Seiki Igarashi, Koji Yano

PCIM Asia 2018; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management(2018)

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摘要
This paper describes the dependence of turn-off switching characteristics on negative gate voltage (-VGE) for IGBT devices. Although the value of - VGE affects the turn-off switching characteristic, that has not been investigated in detail. The experimental result shows that the -VGE affects dvCE/dt and turn-off energy when the gate resistance is relatively large. Because the dvCE/dt is strongly related the discharging current of CGC. In case of the small resistance, the dvCE/dt does not change by the negative gate voltage and gate resistance, because there is a limit of dvCE/dt. In this condition, the load current can be kept only by the swept-out current.
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